Product Description
Solar Cell INSPECTION SYSTEM
Specification
|
Description |
PV WAFER INSPECTION SYSTEM | |
|
MODEL NAME (DEVICE) |
EW2500 |
|
|
APPLICABLE RANGE |
BASE MATERIAL |
SOLAR CELL |
|
PRODUCTIVITY |
UPH |
Over 2,500 WAFER/H |
|
BREAKAGE RATE |
LESS THAN 0.2 % ( ≥ 180µm) |
|
|
FIRST PASS YEILD |
QUALITY |
99.90% |
|
MACHINE WEIGHT |
3.5TON |
|
|
AIR SUPPLY |
OVER 50 PSI |
|
|
POWER SUPPLY |
208~450VAC, 50~60Hz, 2~3 Phase |
|
|
MACHINE DIMENSION |
LXWXH |
4500mm X 1200mm X 1800mm |
|
VISION INSPECTION & MEASURING MODULE |
GEOMETRY & SURFACE INSPECTION |
LENGTH, WIDTH, RECTECANGULARITY |
|
CHIPPING & EDGE DEFECTS |
||
|
CONTAMINATION&STAIN ON THE SURFACE |
||
|
MICRO CRACK INSPECTION |
MICRO CRACK IN THE WAFER 3μm in WIDTH/ 50μm in LENGTH |
|
|
RESISTIVITY&THICKNESS MEASUREMENT |
RESITIVITY : ACCURACY-5%, RANGE:0.3-15ohmcm |
|
|
THICKNESS : THICKNESS : ACCURACY-1% or +-5um, |
||
|
RANGE: 100um-1.5mm |
||
|
LIFETIME MEASUREMENT |
RANGE : 0.1~1000us, repeatability: 3% |
