Product Name : AIS2100C(Scanning Electron Microscope)
Features : AIS 2100 model was designed with respect to a wide range of SEM applications and needs in today’s research and industry.
After 10 years of continuous development AIS2100C has matured to its 3rd generation.
Technology and Certification : CE Certificates
Features
Up-grading version which verified from domestic & overseas market during 10 years (the 3rd generation model).
SEM designed to expands needs of various branches of industry.
1) Equipped with ET-BSE detector for SE and BSE Image acquisition
2) Allows Low KV image(from 1KV) for non-conductive sample
3) Equipped with powerful Analysis S/W & "Measurement Tool"
4) High Scan Speed / High Pixel Resolution
5) Minimized Installation Space(Compact Design)
Specifications
