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Saeron Technology

Electronic microscope, Electron beam welding machine, Scanning electron microscope, Electron beam, FE-SEM and more
Name

Scanning Electron Microscope

Model AIS2000C
Series Compact SEM
Product Description

Product Name : AIS2000C(Scanning Electron Microscope)

Features : Academic Version (Compact Normal SEM) ; Slim design with a wheeled chassis for transport & High Performance

Technology and Certification : CE Certficates

 

Features

"ACADEMIC VERSION"(Compact Normal SEM) 

Transportable slim design for various applications.

1) Compact design with a wheeled chassis for easy transport

2) Allow Low KV Image(from 1KV) for non-conductive sample

3) Equipped with ET-BSE Detector(SE & BSE Image Acquisition) 

4) Digital Zoom(2X, 4X, 8X) & High Pixel Resolution

5) Minimized Installation Space ; 540(W)X570(D)X1500(H)mm³

6) Equipped with powerful "Analysis S/W" and "Measurement Tool"

7) User-Friendly operating system

8) Low Vacuum Mode supply

 

Specifications

Saeron Technology Scanning Electron Microscope AIS2000C