Product Name : FE-SEM(Scanning Electron Microscope)
Features : FE-SEM was also developed for the first time in Korea by name of Seron Technology
Technology and Certification : On Going CE Certificates
Features
MODEL : SEMIRON5000
FE-SEM was also developed in Korea by name of Seron Technologies Inc.
- Be equipped with Conical Obj. Lens
- Be equipped with Auto-stepping & Tiling Function (for Super Pixel resolution with wide FOV)
- High Scan Speed and High Pixel resolution of Linux Environment
- Newly Designed UX/UI -- based on Multi-tasking Window
- Equipped with CCD (For Sample Positionning)
Specifications
