Product Name : HYBRID COMPLEX XEM
Features : High-resolution SEM imaging, Micro Focus X-ray and Micro Joining in one Equipment!
Technology and Certification : 2013 Nano Korea, Innovation NT Convergence Awards Product
Features
High-resolution SEM imaging and X-RAY imaging in one Hybrid System!
1) Possible nm resolution imaging in the implementation of the SEM
2) Convergence System with Realistic price
3) Sub-micron Spot Size and Probe current implementation of more than 100 uA max!
4) Target Spot ease of positioning of the micro-
5) Tungsten Target Metal apply; Target surface state of the sample can be observed
6) Faraday cage current through the probe check
7) Custom Fit Product for a research unit
Specifications
ALL IN ONE (SEM + X-RAY + MICRO JOINING ) HYBRID COMPLEX XEM
