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Saeron Technology

Electronic microscope, Electron beam welding machine, Scanning electron microscope, Electron beam, FE-SEM and more
Name

Scanning Electron Microscope

Model AIS2300C
Series Normal SEM
Product Description

Product Name : AIS2300C(Scanning Electron Microscope)

Features : Seron Technology's high competitive normal SEM which be equipped with optics designed for LOW KV performance

Technology and Certification : 2013, Nano Korea Innovation Awards Product, CE Certficates

 

Features

High Competitive Normal SEM of Seron Technology designed for Low KV Application

2013, Nano Korea Innovation Awards Product !

1) Equipped with powerful "Analysis S/W" & "Measurement tool"

2) User-friendly automation operating System

3) Equipped with ET-BSE detector for SE & BSE Image acquisition 

4) Allows Low KV image(from 0.6KV) for non-conductive sample

5) Upgraded scan speed & Pixel resolution

6) Equipped precision 3-Axis motorized stage (Micro Coordnation)

7) Compact and Slim Design

 

Specifications

Saeron Technology Scanning Electron Microscope AIS2300C

Saeron Technology Scanning Electron Microscope AIS2300C 1

Saeron Technology Scanning Electron Microscope AIS2300C 2