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ATI, Advanced Technology

Semi conductors, LED, PCB, Laser marking system and more
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IMG
Name

Wafer Inspection System
Model WIND
Series Semiconductor
Product Description

Wafer Macro Inspection 

▪ High throughput with dual lens system

▪ Chip inspection after sawing

▪ Kerf inspection

▪ Advanced D2D algorithm using golden die extracted from neighboring 4 dies

▪ Verifying review module included

▪ Self-developed lens for wide field of view and good resolution

▪ Real time auto focusing module adopted

▪ Optional IR inspection to inspect defects, cracks and chippings inside silicon.

ATI, Advanced Technology Wafer Inspection System WIND

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