CIS Sensor & Glass Inspection
▪ Inspection Item
- Glass Top & Bottom Pit, Dent, Particle, Contamination, Scratch, Glass chipping
- Glass Top Defect Photo
- Glass BTM Defect Photo
| Name |
CIS Inspection System |
| Model | ACIS-1200 Series |
| Series | Semiconductor |
Product Description
Products of ATI, Advanced Technology
-
Bio-medical Automation
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High Throughput Screening (Microarray Spotter)
Bio-medical Automation
ezJet
-
High Throughput Screening (Fluorescence Scanner)
Bio-medical Automation
ezScan
-
OEM Product Development (Automated NA Extractor)
Bio-medical Automation
-
OEM Product Development (Cell Isolator)
Bio-medical Automation
-
Laser Application
-
Laser Marking System
Laser Application
LMS Series
-
Fiber Laser Cutting System
Laser Application
ALC-100
-
UV Laser Micro Machining System
Laser Application
ULC-100
-
LED
-
LED Wafer AFVI
LED
AVIS-5000P
-
LED Chip AFVI
LED
AVIS-5000C
-
PCB
-
IC Package Substrate AFVI
PCB
AVIS-1800 Series
-
HDI PCB AFVI
PCB
AVIS-3600 Series
-
IC Package Substrate Sorting System
PCB
ASIS-1000C
-
Semiconductor
-
Wafer Inspection System
Semiconductor
WIND
-
Auto Scope System
Semiconductor
OAK
-
CIS Inspection System
Semiconductor
ACIS-1200 Series
-
Reticle Macro AFVI
Semiconductor
SUN
-
Packaging Inspection System
Semiconductor
CYPRESS