Wafer Defect Inspection System is an optical inspection equipment that inspects foreign material, broken, chip-out, scratch, PAD mark and discolor defects on wafer cell surface automatically
Synapse Imaging
Semi conductor inspection system manufacturer, Inspection equipment, Measuring equipment, SMT, Wafer, FPP panel
| Name |
Wafer Inspection System |
| Series | Semiconductor |
Product Description
Products of Synapse Imaging
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2D/3D Measurement Systems
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3D Dental Scanner
2D/3D Measurement Systems
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Other 3D Measurement Applications
2D/3D Measurement Systems
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Camera Module
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Semi-Auto
Camera Module
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Full-Auto
Camera Module
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Ceramic Green Sheet
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Green Sheet Pattern Inspection System
Ceramic Green Sheet
2D/3D USCAN 3000
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Ceramic Green Sheet Inspection System
Ceramic Green Sheet
2D USCAN 1000
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Green Sheet Via Fill Inspection System
Ceramic Green Sheet
3D USCAN 1000
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Display
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Window Glass Inspection System
Display
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Module Inspection System
Display
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Cell Measurement & Inspection System
Display
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Internal Particle Inspection System
Display
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Edge Inspection System
Display
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Grinder Vision System
Display
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LED
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LED Lead Frame Inspection System
LED
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PCB
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FC Bump Inspection System
PCB
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PCB Laser Marking Vision System
PCB
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PCB Surface Inspection Vision System
PCB
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Semiconductor
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Package Substrate Inspection System
Semiconductor
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Stacked Package Inspection System
Semiconductor
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Image Sensor Package Inspection System
Semiconductor
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Wafer Inspection System
Semiconductor
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Laser & Ink Marking Vision System
Semiconductor
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BGA Ball Placement Vision System
Semiconductor
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Off-Loader BGA Ball Vision System
Semiconductor
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Laser Drilling Vision System
Semiconductor
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BGA SAW & Sort Vision System
Semiconductor
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BGA Singulation Vision System
Semiconductor
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Tray Sorting Vision System
Semiconductor
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Tape & Reel Vision System
Semiconductor
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Trim Vision System
Semiconductor
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SMT
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Desktop 3D Solder Paste Inspection System
SMT
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In-line 3D Solder Paste Inspection System
SMT