| Description |
To measure complex pattern of Color Filter and Array |
| Features |
Non-Destructive Measurement |
| Application | Color Filter, Array, Cell Process |
| Name |
Pattern Thickness Measurement System (PTMS) |
| Series | LED |
Product Description
Products of SNU Precision
-
LED
-
Photo Spacer Inspection System (PSIS)
LED
-
Halfton CD (Critical Dimension Measurement System)
LED
-
Align Measurement System (AMS)
LED
-
Mask Particle Inspection System (MPIS)
LED
-
Sealant Disconnection Inspection & Repair System (SDIS)
LED
-
Automicro System
LED
-
Review Repair
LED
-
Pattern Thickness Measurement System (PTMS)
LED
-
OLED
-
EL3600
OLED
-
HELISYS
OLED
-
Deposition System (DSP)
OLED
-
Thin Film Encapsulation (TFE System)
OLED
-
Sputter
OLED
-
Optical Measurement
-
Optical Measurement
SIS-1200 Plus
-
Optical Measurement
SIS-1200
-
Solar Photovoltaic
-
Thin Film Solar Cell System (CIGS)
Solar Photovoltaic
-
Organic Thin Film Solar Cell (OPV)
Solar Photovoltaic
-
Si Thin Film Solar Cell System (a-Si)
Solar Photovoltaic
-
Dye Sensitized Solar Cell (DSSC)
Solar Photovoltaic
-
Laser Scriber
Solar Photovoltaic