| Description |
Particle on glass is very harmful to mask of proximate exposure. |
| Features |
Whole glass scan Fast tact time, |
| Application |
Proximate exposure process, rocation of Particle Inspection. |
| Name |
Mask Particle Inspection System (MPIS) |
| Series | LED |
Product Description
Products of SNU Precision
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LED
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Photo Spacer Inspection System (PSIS)
LED
-
Halfton CD (Critical Dimension Measurement System)
LED
-
Align Measurement System (AMS)
LED
-
Mask Particle Inspection System (MPIS)
LED
-
Sealant Disconnection Inspection & Repair System (SDIS)
LED
-
Automicro System
LED
-
Review Repair
LED
-
Pattern Thickness Measurement System (PTMS)
LED
-
OLED
-
EL3600
OLED
-
HELISYS
OLED
-
Deposition System (DSP)
OLED
-
Thin Film Encapsulation (TFE System)
OLED
-
Sputter
OLED
-
Optical Measurement
-
Optical Measurement
SIS-1200 Plus
-
Optical Measurement
SIS-1200
-
Solar Photovoltaic
-
Thin Film Solar Cell System (CIGS)
Solar Photovoltaic
-
Organic Thin Film Solar Cell (OPV)
Solar Photovoltaic
-
Si Thin Film Solar Cell System (a-Si)
Solar Photovoltaic
-
Dye Sensitized Solar Cell (DSSC)
Solar Photovoltaic
-
Laser Scriber
Solar Photovoltaic